IIT BHU Syllabus Advanced Techniques for Materials Characterization
Advanced Techniques for Materials Characterization
X-ray diffraction. Diffraction under non-ideal conditions. Atomic scattering and Geometrical structure factors.
Factors influencing the intensities of diffracted beams. Powder X-ray diffractometer. Applications of XRD in
Study of the morphology, aggregation, size and microstructure of ceramic materials using. Optical microscope,
quantitative phase analysis.
Principle of electron microscopy. Construction and operation of Transmission Electron Microscope and Scanning
Electron Microscope. Electron diffraction by crystalline solids; selected area diffraction. Atomic Force Microscope.
Mechanism of image formation in SEM and its processing. Electron microprobe analysis (EDAX and WDS).
Preparation of ceramic samples for electron microscopic studies. ESCA and PES.
Spectrophotometric analysis of ceramic materials: Basic laws of spectrophotometry and its application in micro
analysis in UV/ Visible range, effect of reflectance factor on optical analysis, construction and working principle of
spectrophotometer, importance of additive absorbances in multiple analysis of materials.
Infrared spectrophotometry : General aspects of IR spectroscopy and its application in structural analysis of ceramic
systems, sources of IR radiations, Optical systems and operation of FTIR spectrophotometers. Samples preparation,
IR analysis and structural co-relations.
Fluorescence and Phosphorescence spectroscopy: Basic principle, geometrical optics, construction, working
principle and use of fluorescence spectrometers in materials analysis. XRF and on-line analysis of ceramic materials.
Electron Spin Resonance spectroscopy in ceramic systems. DTA, TGA and DSC with suitable examples of glass
and ceramic materials.