<\/p>\n
<\/p>\n
<\/p>\n
Advanced Techniques for Materials Characterization<\/p>\n
X-ray diffraction.\u00a0 Diffraction under non-ideal conditions.\u00a0 Atomic scattering and Geometrical structure factors.<\/p>\n
Factors influencing the intensities of diffracted beams. Powder X-ray diffractometer.\u00a0 Applications of XRD in<\/p>\n
ceramic materials.<\/p>\n
Study of the morphology, aggregation, size and microstructure of ceramic materials using. Optical microscope,<\/p>\n
quantitative phase analysis.<\/p>\n
Principle of electron microscopy. Construction and operation of Transmission Electron Microscope and Scanning<\/p>\n
Electron Microscope. Electron diffraction by crystalline solids; selected area diffraction. Atomic Force Microscope.<\/p>\n
Mechanism of image formation in SEM and its processing. Electron microprobe analysis (EDAX and WDS).<\/p>\n
Preparation of ceramic samples for electron microscopic studies. ESCA and PES.<\/p>\n
Spectrophotometric analysis of ceramic materials: Basic laws of spectrophotometry and its application\u00a0 in micro<\/p>\n
analysis in UV\/ Visible range, effect of reflectance factor on optical analysis, construction and working principle of<\/p>\n
spectrophotometer, importance of additive absorbances in multiple analysis of materials.<\/p>\n
Infrared spectrophotometry : General aspects of IR spectroscopy and its application in structural analysis of ceramic<\/p>\n
systems, sources of IR radiations, Optical systems and operation of FTIR spectrophotometers. Samples preparation,<\/p>\n
IR analysis and structural\u00a0 co-relations.<\/p>\n
Fluorescence and Phosphorescence spectroscopy: Basic principle, geometrical optics, construction, working<\/p>\n
principle and use of fluorescence spectrometers in materials analysis. XRF and on-line analysis of ceramic materials.<\/p>\n
Electron Spin Resonance spectroscopy in ceramic\u00a0 systems. DTA, TGA and DSC with suitable examples of glass<\/p>\n
and ceramic materials.<\/p>\n","protected":false},"excerpt":{"rendered":"
IIT BHU Syllabus \u00a0Advanced Techniques for Materials Characterization Advanced Techniques for Materials Characterization X-ray diffraction.\u00a0 Diffraction under non-ideal conditions.\u00a0 Atomic scattering and Geometrical structure factors. Factors influencing the intensities of diffracted beams. Powder X-ray diffractometer.\u00a0 Applications of XRD in ceramic materials. Study of the morphology, aggregation, size and microstructure of ceramic materials … Read more<\/a><\/p>\n","protected":false},"author":1,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"fifu_image_url":"","fifu_image_alt":""},"categories":[1],"tags":[],"amp_enabled":true,"_links":{"self":[{"href":"https:\/\/www.kopykitab.com\/blog\/wp-json\/wp\/v2\/posts\/13548"}],"collection":[{"href":"https:\/\/www.kopykitab.com\/blog\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.kopykitab.com\/blog\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.kopykitab.com\/blog\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.kopykitab.com\/blog\/wp-json\/wp\/v2\/comments?post=13548"}],"version-history":[{"count":0,"href":"https:\/\/www.kopykitab.com\/blog\/wp-json\/wp\/v2\/posts\/13548\/revisions"}],"wp:attachment":[{"href":"https:\/\/www.kopykitab.com\/blog\/wp-json\/wp\/v2\/media?parent=13548"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.kopykitab.com\/blog\/wp-json\/wp\/v2\/categories?post=13548"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.kopykitab.com\/blog\/wp-json\/wp\/v2\/tags?post=13548"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}