VLSI Testing Syllabus NIT Jalandhar

VLSI Testing Syllabus NIT Jalandhar  EC-467 VLSI Testing [3 0 0 3] Unit-I Introduction -Scope of testing and verification in VLSI design process. Problem in analog and digital testing. Logic simulation & Fault modelling: Circuit Modelling Compiled simulation Event-driven simulation. Simulation Techniques. Fault detection and redundancy. Fault equivalence and fault dominance. Stuck-at faults bridging faults, transistor faults, delay … Read more VLSI Testing Syllabus NIT Jalandhar