VLSI Testing Syllabus NIT Jalandhar

VLSI Testing Syllabus NIT Jalandhar  EC-467 VLSI Testing [3 0 0 3] Unit-I Introduction -Scope of testing and verification in VLSI design process. Problem in analog and digital testing. Logic simulation & Fault modelling: Circuit Modelling Compiled simulation Event-driven simulation. Simulation Techniques. Fault detection and redundancy. Fault equivalence and fault dominance. Stuck-at faults bridging faults, transistor faults, delay … Read more VLSI Testing Syllabus NIT Jalandhar

NIT Jalandhar Syllabus for Analog IC Design

Analog IC Design Syllabus for NIT Jalandhar Analog IC Design Unit-I Review of MOS Devices: MOS transistor models. NMOS, PMOS, CMOS, Introduction to analog VLSI and mixed signal issues in CMOS technologies Basics of system hardware design methodology: Hierarchical design using top-down and bottom-up methodology Basic Electrical Properties And Circuit Concepts: Basic Electrical Properties of MOS circuits: … Read more NIT Jalandhar Syllabus for Analog IC Design